WIDADI, S.; KHAIRUL HUDA, M.; AHMAD, I.; TANANE, O. Atmega328P-based X-ray Machine Exposure Time Measurement Device with an Android Interface. Journal of Robotics and Control (JRC), [S. l.], v. 1, n. 3, p. 81–85, 2020. DOI: 10.18196/jrc.1318. Disponível em: https://journal.umy.ac.id/index.php/jrc/article/view/7723. Acesso em: 16 sep. 2025.