Editorial Policies

Focus and Scope

The scientific journal of of SEMESTA TEKNIKA  is a peer reviewed journal publishing high-quality articles dedicated to basic and applied research in engineering science – an interdisciplinary field dealing with:

  • material and mechanical engineering
  • civil engineering and design
  • infrastructure management and engineering
  • construction engineering and management
  • electrical, electronic engineering and system
  • industrial engineering and management
  • information and computer science and technology
  • urban planning, transportation system and logistics


Section Policies


Checked Open Submissions Checked Indexed Checked Peer Reviewed

Peer Review Process

Manuscripts submitted to SEMESTA TEKNIKA will be reviewed by the Editorial Board and at least two reviewers that will be published in SEMESTA TEKNIKA carried out through double blind peer review. The manuscript will be evaluated based on its appropriateness for topic and scope of SEMESTA TEKNIKA, contribution to the discipline, cogency of the analysis, clarity of presentation and technical adequacy. Editors and reviewers provide constructive feedback on the evaluation results to the author.

If the author does not get confirmation from Semesta Teknika for long time, author can confirm by email in semesta_teknika@umy.ac.id or via WhatsApp in 085729357100


Open Access Policy

This journal provides immediate open access to its content on the principle that making research freely available to the public supports a greater global exchange of knowledge.



This journal utilizes the LOCKSS system to create a distributed archiving system among participating libraries and permits those libraries to create permanent archives of the journal for purposes of preservation and restoration. More...


Plagiarism Policy

SEMESTA TEKNIKA Journal will immediately reject papers leading to plagiarism or self-plagiarism. Articles submitted to SEMESTA TEKNIKA will be screened for plagiarism using Turnitin plagiarism Checker detection tools with similarity maximum 15%.