Enhancing Fault Detection in Wireless Sensor Networks Through Support Vector Machines: A Comprehensive Study

Yerik Mardenov, Aigul Adamova, Tamara Zhukabayeva, Mohamed Othman

Abstract


The Wireless Sensor Network (WSN) consists of many sensors that are distributed in a specific area for the purpose of monitoring physical conditions. Factors such as hardware limitations, limited resources, unfavourable WSN deployment environment, and the presence of various attacks on nodes can lead to the presence of Faulty Nodes in a WSN. This raises the problem of detecting Faulty Nodes and avoiding Data loss. Detecting Faulty Nodes in real-world scenarios will improve the quality of a WSN. The research was aimed at developing an algorithm to determine the location of Faulty Nodes in a WSN. The algorithm uses characteristics of Machine Learning and Support Vector Machines (SVM), which use the classification of Data into true and false. A Mathematical Model for determining Faulty Nodes using the SVM is considered. A methodology for detecting a Faulty Node is demonstrated, which consists of Data Collection, Feature Extraction, Training, and Testing the Model. The Results of simulated experiments that were conducted with different numbers of nodes from 50 to 320 are shown. The Model is tested on Data very similar to real-world sensing Data to evaluate the ability of the Model to detect failed nodes and calculate training and testing errors. As a result, the training error is 4.6667%, the accuracy of detecting faulty nodes was 97%. The simulation results demonstrate the high stability of the proposed algorithm and are suitable for network environments with irregular node distribution or coverage gaps. In real scenarios, it can provide a high level of uninterrupted operation of the WSN and lossless data transmission. Shortcomings and prospects in research on fault detection in WSN, such as studying real-world hardware issues and its security, were presented.

Keywords


Wireless Sensor Network; SVM; Faulty Node Detection; Attacked Node; Machine Learning.

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DOI: https://doi.org/10.18196/jrc.v4i6.20216

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